Development of a method for robust smoothing of MT data and application to robust stacking methos for EDI files

Negi, Tateyuki; Umeda, Koji; Matsuo, Koichi*; Asamori, Koichi

Shadan Hojin Butsuri Tansa Gakkai Dai-117-Kai (Heisei-19-Nendo Shuki) Gakujutsu Koenkai Koen Rombunshu, p.195 - 198, 2007/10

MT survey has been applied to various fields in recent years. It is recognized as effective method to know deep resistivity structure. However, it is difficult to acquire interpretable quality data in highly noisy environments, because natural electromagnetic fields are used in the MT survey. To apply MT survey in such environments, it is important to develop robust stacking method to improve the quality of MT spectrum data. In the last SEGJ conference held in Spring 2007, we have reported effective robust stacking method based on MT reliability index shown in Negi et al (2005). In the fall conference, we report the development of robust smoothing method of MT data to compile with the robust stacking method. As a result of application to poor quality data, it was improved to interpretable quality data in short time. Therefore, it is expected to be effective and practical stacking method for the poor quality data.